The Institute of Microelectronics of the Chinese Academy of Sciences has made important progress in the field of semiconductor device physics
The specific physical reasons for the widely exhibited nonlinear volt-ampere (IV) characteristics of semiconductor devices at low temperatures have been one of the most widely concerned topics in the past two decades. Previously, most studies attributed the nonlinear IV characteristics to the uniform modulation effect of the electric field on the electronic transition rate in semiconductor materials. This explanation not only failed to solve the problem of nonlinear transport, but also sparked more intense debates...
Due to the widespread disorder factors such as defect states in semiconductor devices, the transport of carriers often takes the form of transitions. Due to the complex types of defect states in semiconductors, it has always been a difficult and important topic in this field to accurately understand and describe the carrier transport and macroscopic electrical properties in semiconductor devices.
The specific physical reasons for the nonlinear volt-ampere ( IV ) characteristics widely exhibited by semiconductor devices at low temperatures have been one of the most widely concerned topics in the past two decades. Previously, most studies attributed the nonlinear IV characteristics to the uniform modulation effect of the electric field on the electron transition rate in semiconductor materials. This explanation not only did not solve the problem of nonlinear transport, but caused more intense debates (Nat. Mater. 8, 572(2009); Phys. Rev. Lett. 105, 156604 (2010)).
In response to such problems and debates, the team of academician Liu Ming from the Key Laboratory of Microelectronic Devices and Integrated Technology of the Institute of Microelectronics proposed the physical mechanism of the "collective transport" of carriers from a theoretical perspective. The theory holds that the non-uniform distribution of percolation path growth caused by the external electric field produces a collective transport effect, which in turn leads to nonlinear IV characteristics at the device scale. In terms of experiments, the team further realized the control of the percolation threshold of the device by skillfully controlling the dimension of the semiconductor in the polymer device. On this basis, it was directly confirmed that the nonlinear transport comes from the collective transport by controlling the nonlinear degree of the device IV . this assumption. This work unifies various hypotheses that have been controversial on this topic, and provides a theoretical basis for the development of methods to manipulate the I - V characteristics of semiconductor devices.
Due to the widespread disorder factors such as defect states in semiconductor devices, the transport of carriers often takes the form of transitions. Due to the complex types of defect states in semiconductors, it has always been a difficult and important topic in this field to accurately understand and describe the carrier transport and macroscopic electrical properties in semiconductor devices.
The specific physical reasons for the nonlinear volt-ampere ( IV ) characteristics widely exhibited by semiconductor devices at low temperatures have been one of the most widely concerned topics in the past two decades. Previously, most studies attributed the nonlinear IV characteristics to the uniform modulation effect of the electric field on the electron transition rate in semiconductor materials. This explanation not only did not solve the problem of nonlinear transport, but caused more intense debates (Nat. Mater. 8, 572(2009); Phys. Rev. Lett. 105, 156604 (2010)).
In response to such problems and debates, the team of academician Liu Ming from the Key Laboratory of Microelectronic Devices and Integrated Technology of the Institute of Microelectronics proposed the physical mechanism of the "collective transport" of carriers from a theoretical perspective. The theory holds that the non-uniform distribution of percolation path growth caused by the external electric field produces a collective transport effect, which in turn leads to nonlinear IV characteristics at the device scale. In terms of experiments, the team further realized the control of the percolation threshold of the device by skillfully controlling the dimension of the semiconductor in the polymer device. On this basis, it was directly confirmed that the nonlinear transport comes from the collective transport by controlling the nonlinear degree of the device IV . this assumption. This work unifies various hypotheses that have been controversial on this topic, and provides a theoretical basis for the development of methods to manipulate the I - V characteristics of semiconductor devices.