So they are developing EUV masks at Shanghai Synchrotron Radiation Facility
No.02
EUV actinic reticle inspection beamline at Shanghai Synchrotron Radiation Facility
上海光源极紫外光刻掩模版检验光束线
来自上海高等研究院的Yong Wang作了题为《上海光源极紫外光刻掩模版检验光束线》的报告。
报告中提到上海光源(SSRF)建造了一条用于极紫外光刻掩模版检测的专用光束线。SSRF能够产生稳定且纯净的13.5nm的极紫外光,用于检测和审查极紫外光刻掩模版的缺陷。其通过使用傅里叶合成照明和离轴区平面成像技术,实现了高数值孔径(NA)和高分辨率。暗场散射模式被用来实现对掩模版缺陷的高灵敏检测。该光束线的设计目标是达到30nm的掩模版成像分辨率和30nm的检测灵敏度。检测(inspection)模式和检查(review)模式被集成在一个紧凑的腔体内,两种模式切换便捷。该光束线目前正在调试中,预计将在今年完成。
Yong Wang from Shanghai Advanced Research Institute gave a report titled "Shanghai Light Source EUV Lithography Mask Inspection Beamline".
The report mentioned that Shanghai Light Source (SSRF) has built a dedicated beamline for EUV lithography mask inspection. SSRF is able to generate stable and pure 13.5nm EUV light for detecting and reviewing defects in EUV lithography masks. It achieves high numerical aperture (NA) and high resolution by using Fourier synthesis illumination and off-axis plane imaging technology. Dark field scattering mode is used to achieve high-sensitivity detection of mask defects. The design goal of this beamline is to achieve a mask imaging resolution of 30nm and a detection sensitivity of 30nm. The inspection mode and review mode are integrated in a compact cavity, and the two modes can be easily switched. The beamline is currently being debugged and is expected to be completed this year.
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