The company’s progress in new product R&D iterations and market direction mainly includes:
1. Integrated circuit EDA software
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Deeply explore the technical value of integrated circuit yield improvement and launched an efficient process monitoring (PCM) solution. Taking advantage of the synergy between software and hardware, the original yield improvement solution for process development has been expanded and applied to mass production. Currently, the solution has been verified and optimized in multiple production lines, and some production lines have entered application delivery.
-Extended layout manufacturability (DFM) series EDA software to reduce chip development difficulty and manufacturing costs. We independently developed CMP EXPLORER, a modeling tool for the chemical mechanical polishing process. By identifying CMP process hot spots and repairing them in advance, we can achieve design optimization, improve the process yield at the manufacturing end, and reduce yield risks. The software is currently being trialled and introduced in many domestic leading wafer fabs.
-Released the leading one-stop testability (DFT) design solution to further improve the chip yield improvement solution. The solutions launched by the company cover the DFT full-process design tool DFTEXP and related design services, support the DFT design implementation needs of chips and scales in different application fields such as MCU, AI, GPU, Network, 5G baseband, AP, etc., and support In for system-level testing. -System-Test, to support functional safety testing solutions for automotive electronics. In addition, the DFT design tool can synergize and complement the company's existing DE-YMS yield analysis and management system, helping chip design companies reduce costs and increase efficiency when developing products, and more quickly discover faults and trace the root causes of yield.
2. Semiconductor big data analysis and management system
-The existing offline data analysis and management system has gradually entered the business implementation stage. The company has developed technologically advanced semiconductor offline data analysis systems, including semiconductor general analysis tool DE-G, integrated circuit yield analysis and management system DE-YMS, integrated circuit defect management system DE-DMS, and automatic defect classification system DE -ADC and other products have been maturely developed and have entered the stage of market expansion and commercial implementation.
-Continue to extend the layout of the online big data analysis and management system. Based on the data analysis experience of offline data, we continue to expand intelligent online data tools. The company's semiconductor equipment abnormality monitoring and classification system DE-FDC product has completed the first version and has been trialled by customers in wafer factories and packaging and testing plants. stage.
-Artificial intelligence technology assists the iterative upgrade of the company’s intelligent data system. The company uses the independently developed defect automatic classification system DE-ADC based on cutting-edge artificial intelligence vision technology, and expands and extends the development of Inf-AI, a one-stop machine learning platform for semiconductors, to achieve efficient and high-precision classification of wafer defects. The company uses advanced AI models to automatically model and analyze equipment sensor signals, and dynamically updates the model through historical data to capture more types of anomalies, realize automatic feature value control (Feature AutoSpec) changes, and dynamic sensor parameter curves (Raw Trace) It has excellent card control, reduces false alarms, significantly reduces usage and operation and maintenance costs, and can deeply cooperate with DE-DMS, with the ability to continue learning. Currently, the system has been deployed and used by many integrated circuit companies and has been well received by customers.
3. Wafer-level electrical testing equipment
-Optimized and upgraded the new generation of universal high-performance semiconductor parameter testing equipment (T4000 model). The equipment can cover the testing needs of LOGIC, CIS, DRAM, SRAM, FLASH, BCD and other products, and supports the parameter testing of third-generation compound semiconductors (SiC/GaN). The testing efficiency is effectively improved and has a high cost performance. It is suitable for applications in Cost-sensitive compound semiconductor production lines of 8 inches and below.
-Added wafer level reliability (WLR) test equipment category. The company has developed functions such as a reliability test analysis system based on the architecture of the T4000 model WAT test equipment, extending the equipment from WAT testing to WLR and SPICE and other fields. It supports intelligent parallel testing, which can greatly shorten the test time of WLR. At the same time, it can Combined with the customized software system provided by the company to improve user work efficiency.