China's chip firms see revenue surge as Beijing seeks semiconductor self-reliance
Sales have fallen for five straight quarters. In the three months ended in August, Micron’s revenue declined 40% to $4.01 billion.
The demand and application of high thermal conductivity silicon carbide ceramics in the semiconductor field
At present, silicon carbide (SiC) is a thermally conductive ceramic material that is actively researched at home and abroad. The theoretical thermal conductivity of SiC is very high, with some crystal forms reaching 270W/mK, making it a leader among non-conductive materials. For example, the application of SiC thermal conductivity can be seen in substrate materials for semiconductor devices, high thermal conductivity ceramic materials, heaters and heating plates for semiconductor processing, capsule materials for nuclear fuel, and gas sealing rings for compressor pumps.
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Coatings such as diamond-like carbon (DLC) can be coated on the surface to enhance performance, alleviate wafer damage, and prevent contamination...
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That facility could be a public private project, public part will use some of the EUV capacity to do research into materials and optics. Some of the capacity might be reserved for SMIC and Huawei to create 5nm chips. After some years SMIC and Huawei might create their own private SSMB-EUV facilities..This is a very good video.
Just one problem for me, it was what was said near the end.
The presenter acknowledged, judging by the science, that the light source was proven to be real, that they can get that beam or light to have the right requirements.
In short, the science is real.
But, if the science is real, then why build another research facility. Why go through that expense to verify something that you already verified. That makes no sense.
There is a con job going on here.
Either the whole idea of SSMB-EUV is all fake, and that is why they are building that research facility. For further research.
Or, that, it is real, but they won't admit to anything, other than that they are building a research facility.
These mysterious questions, seem to tie into that Huawei EUV patent for me.
That Hauwei EUV patent is different from the ASML EUV patent.
Weird, huh?
No answers.
I think I will think of something else, sing a song, take a walk.
Don't worry, be happy.
Other interesting past works in Russia included the development of the synchrotron X-ray radiation source in Zelenograd in the mid-1980s. This technology was apparently developed by forward looking scientists for the needs of microelectronics processing, but plans weren't followed through. It will now be used in this newly funded X-ray lithography research, but new devices based on it should be ready by 2023.
My knowledge of Material science is low, so just want to ask, is there even Silicon molecules below 1nm?SSMB easily can do sub-1nm
The nano meter metric is just a marketing term.My knowledge of Material science is low, so just want to ask, is there even Silicon molecules below 1nm?
As far as my knowledge, these NM values are now just marketing terms, The actual dimension of transistors and pathways for so called 3 NM process from TSMC is like 20NM.
So, what does doing sub 1nm lithography even mean?
This is a very good video.
Just one problem for me, it was what was said near the end.
The presenter acknowledged, judging by the science, that the light source was proven to be real, that they can get that beam or light to have the right requirements.
In short, the science is real.
But, if the science is real, then why build another research facility. Why go through that expense to verify something that you already verified. That makes no sense.
There is a con job going on here.
Either the whole idea of SSMB-EUV is all fake, and that is why they are building that research facility. For further research.
Or, that, it is real, but they won't admit to anything, other than that they are building a research facility.
These mysterious questions, seem to tie into that Huawei EUV patent for me.
That Hauwei EUV patent is different from the ASML EUV patent.
Weird, huh?
No answers.
I think I will think of something else, sing a song, take a walk.
Don't worry, be happy.
In some possible implementations, the coherent light source is a Free Electron Laser (FEL) light source; the FEL light source utilizes the interaction of free electrons and optical radiation, transfers the electron energy to the optical radiation to increase the radiation intensity so as to obtain laser output, and further the FEL extreme ultraviolet light has the advantages of adjustable wavelength, high collimation degree, high stability, low energy dispersion, high brightness and the like.
An embodiment of the present application further provides a method for controlling a lithographic apparatus as provided in any one of the foregoing possible implementations, including: controlling the reflector to rotate; the light emitted by the coherent light source is projected to the reflecting surface of the reflector, and the reflected light is divided into a plurality of sub-beams by the illumination system and then projected to the mask.
Under the condition, the phase of the light is continuously changed by controlling the reflection of the light emitted by the coherent light source through the rotating reflector, so that the interference pattern of the coherent light formed in the illumination area of the mask after passing through the illumination system is continuously changed, the accumulated light intensity of the illumination field of view of the mask in the exposure time is homogenized, the purpose of light homogenization is achieved, and the problem that the coherent light cannot be homogenized due to the fact that the coherent light forms a fixed interference pattern in the related art is solved.
In some possible implementations, controlling the projection of the light emitted by the coherent light source onto the reflective surface of the mirror includes: the control device is used for controlling the light rays emitted by the coherent light source to be projected to the region of the reflecting surface of the reflector, which is deviated from the center. Under the condition, the aperture of the reflector is increased, and the incident light beam is controlled to be projected to the part of the reflector, which is deviated from the center, so that the phase of the sub-light beam of the part with stronger light intensity at the center part can be effectively randomized, and the decoherence performance of the reflector is improved.