- In this work, a 2.5 × 2.5 mm2 large-area 4H-SiC Schottky barrier photodiode with a grid-shaped semitransparent metal electrode is designed and fabricated for extreme ultraviolet (EUV) detection
- Based on a synchrotron radiation source, the photo-response characteristics of the photodiode is measured between 5nm and 140nm
- EUV detectors are the key component used for monitoring and calibrating photon beam intensity
Very interesting!
So, this was obviously used for testing EUV light, sourced from either the SSMB or SSRF, or both. Even more interesting that 5nm-140nm wavelengths were tested. Unlike LPP generated EUV, synchrotrons can easily tune the wavelength and in a very real sense make up for photoresist sensitivity that might be most optimal for wavelengths other than 13.5nm. Imagine using 11.2nm instead of 13.5nm and realizing <7nm features using the same 7nm process. Conversion efficiency isn't as big an issue so tuning the wavelength would achieve what would otherwise need lithium powered LPP EUV.
On a related note, does anybody know how photoresists would react with uber powered synchrotron generated EUV source power in the multi-kilowatt range? I imagine a synchrotron driven EUV litho machine would simply run faster. With that much power, photoresist parameters could be looser such that photoresists would be an easier bottleneck to crack vs photoresist designed for much lower powered EUV light sources. Photoresist over-exposure might also become an issue on the flip side so comments to this are appreciated.