Gaoshi Semiconductor's nano-scale pattern wafer defect detection mass production equipment is exported to Malaysia's leading customer.
At the beginning of the new year in 2024, Suzhou Gaoshi Semiconductor's nano-scale pattern wafer defect detection mass production equipment, 2D & 3D inspection, will be exported to Malaysia's top customers. Gaoshi Semiconductor has been committed to the development and manufacturing of semiconductor wafer inspection equipment, and has been recognized by many domestic and foreign customers over the years.
Gaoshi Semiconductor has been adhering to the localization of semiconductor equipment and promoting the development of the domestic visual field. By constantly cultivating internal skills and overcoming technical difficulties, we have delivered batches of equipment to customers in China. At the same time, we aim at the international market, break through the country, and demonstrate domestic visual inspection technology on the international stage.
Gaoshi Technology (Suzhou) Co., Ltd. was established in 2015. It is an overall solution provider for industrial vision based on AI. The company has three major business segments: semiconductor industry inspection, screen industry inspection, and new energy industry inspection. It has an industry-experienced professional R&D team, with R&D personnel accounting for more than 80%, and the average annual scientific research investment accounting for more than 20%. In recent years, the semiconductor industry represented by wafer chips has become a national strategic emerging industry. Its subsidiary Suzhou Gaoshi Semiconductor Technology Co., Ltd. is a high-tech modern company with machine vision and artificial intelligence as its technical core, focusing on the optical inspection link in the front-end and back-end semiconductor wafer manufacturing processes, and providing inspection equipment and solutions to the industry. . The products cover all aspects and technology nodes of the semiconductor wafer process, including patternless wafer inspection, patterned wafer inspection and measurement, 2D & 3D critical dimension measurement, accurate defect classification (ADC) and process and quality management system (GOINFO) , providing data analysis and process guidance for semiconductor wafer manufacturing processes.